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Trapping Radiation – Multiple Reflections for EMI Shielding
Innately poor film morphology during thermal evaporation can trap radiation, significantly boosting a metal’s electromagnetic interference (EMI) shielding performance. Unlike high-quality, dense metal films that primarily rely on reflection for shielding, films deposited by thermal evaporation often have a porous or nanostructured morphology. This intrinsic nanostructure enhances shielding through multiple internal reflections and absorption mechanisms,…
Read MoreEMI Shielding With Vacuum Metallization – A Two-Layer Approach
The Benefits of Vacuum Metallization for EMI/RFI Shielding: A Two-Layer Approach In today’s world of high-speed electronics and wireless communication, electromagnetic interference (EMI) and radio frequency interference (RFI) pose significant challenges. Effective shielding solutions are necessary to ensure the optimal performance of sensitive electronic components. One of the most efficient methods for EMI/RFI shielding is…
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